K. Yagami et al., Enhancement of exchange bias in Mn-Ir/Co-Fe based spin valves with an ultrathin Cu underlayer and in situ Mn-Ir surface modification, J APPL PHYS, 89(11), 2001, pp. 6609-6611
Enhancement of exchange bias induced at the interface of the antiferromagne
tic (AF)/ferromagnetic (F) layers was studied using the bottom "spin-valve
films" (SVs) with the Mn-Ir/Co-Fe exchange coupled films. Exchange bias inc
reased using an ultrathin Cu underlayer. Meanwhile, both exchange bias fiel
d, H-ex, and blocking temperature, T-B, increased intensively by heating sp
ecimens after depositing Mn-Ir film in a high vacuum. These two enhancement
effects worked in an additive. As a result, an unidirectional anisotropy c
onstant, J(K), of 0.39 erg/cm(2) (H-ex of 1.3 kOe) and T-B of similar to 32
5 degreesC were obtained for the bottom SVs with a total thickness of 233 A
ngstrom including an AF layer of 68 Angstrom Mn74Ir26 and a pinned layer of
20 Angstrom Co90Fe10, where the SVs were field annealed at 320 degreesC. A
microstructural analysis using x-ray diffraction revealed that H-ex did no
t depend on the diffraction intensity from Mn-Ir (111) for the SVs with var
ious underlayers, and no remarkable changes occurred in the microstructure
of the SVs with the heating treatment in a vacuum. Therefore, the enhanceme
nt effects might result from some changes in the microstructure and/or the
morphology of the interface of AF/F layers. (C) 2001 American Institute of
Physics.