Stress-induced metallic behavior under magnetic field in Pr1-xCaxMnO3 (x=0.5 and 0.4) thin films (invited)

Citation
W. Prellier et al., Stress-induced metallic behavior under magnetic field in Pr1-xCaxMnO3 (x=0.5 and 0.4) thin films (invited), J APPL PHYS, 89(11), 2001, pp. 6612-6617
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
11
Year of publication
2001
Part
2
Pages
6612 - 6617
Database
ISI
SICI code
0021-8979(20010601)89:11<6612:SMBUMF>2.0.ZU;2-B
Abstract
We have investigated the role of the stress induced by the presence of the substrate in thin films of colossal magnetoresistive manganites on structur al, resistive, and magnetic properties. Because of the strong coupling betw een the small structural distortions related to the charge ordering (CO) an d the resistive properties, the presence of the substrate prevents the full development of the charge ordering in Pr0.5Ca0.5MnO3, especially in the ve ry thin films. For thicker films, the CO state exists, but is not fully dev eloped. Correlatively, the magnetic field which is necessary to suppress th e CO is decreased drastically from 25 T to about 5 T on SrTiO3 substrates. We have also investigated the influence of the doping level by studying the case of Pr0.6Ca0.4MnO3. (C) 2001 American Institute of Physics.