Anisotropic tunneling magnetoresistance in GaMnAs/AlAs/GaMnAs ferromagnetic semiconductor tunnel junctions

Citation
Y. Higo et al., Anisotropic tunneling magnetoresistance in GaMnAs/AlAs/GaMnAs ferromagnetic semiconductor tunnel junctions, J APPL PHYS, 89(11), 2001, pp. 6745-6747
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
11
Year of publication
2001
Part
2
Pages
6745 - 6747
Database
ISI
SICI code
0021-8979(20010601)89:11<6745:ATMIGF>2.0.ZU;2-Q
Abstract
We have observed very large tunneling magnetoresistance (TMR) in Ga1-xMnxAs /AlAs/Ga1-xMnxAs ferromagnetic semiconductor tunnel junctions. A TMR ratio as high as 75% was obtained in a junction with a thin (1.5 nm) AlAs tunnel barrier when the magnetic field was applied along the [100] axis in the fil m plane. The TMR ratio decreased when the applied magnetic field direction was along the [1(1) over bar $0] and [110]. This anisotropic TMR was found to be explained by the single-domain theory assuming cubic magnetic anisotr opy with the easy axis of [100], which is induced by the zincblende-type Ga 1-xMnxAs crystal structure. (C) 2001 American Institute of Physics.