Flux lattice imaging of a patterned niobium thin film

Citation
M. Roseman et al., Flux lattice imaging of a patterned niobium thin film, J APPL PHYS, 89(11), 2001, pp. 6787-6789
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
11
Year of publication
2001
Part
2
Pages
6787 - 6789
Database
ISI
SICI code
0021-8979(20010601)89:11<6787:FLIOAP>2.0.ZU;2-U
Abstract
Using our cryogenic magnetic force microscope, we have investigated a super conducting Nb thin film, 100 nm in thickness with T-c similar to 6.5 K. The film is patterned with a square array (1 mum x 1 mum) of antidots, which s erve as artificial pinning centers for magnetic flux. We have observed flux lattice matching as a function of applied magnetic field and temperature, for field strengths up to the third matching field, with evidence of flux d ragging by the tip around the antidots. Force gradient distance curves acqu ired at temperatures about T-c clearly demonstrate an observable Meissner f orce between tip and sample, and allow for an estimation of the magnetic sc reening penetration depth. (C) 2001 American Institute of Physics.