Micromagnetic modeling of the effects of stress on magnetic properties

Citation
B. Zhu et al., Micromagnetic modeling of the effects of stress on magnetic properties, J APPL PHYS, 89(11), 2001, pp. 7009-7011
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
11
Year of publication
2001
Part
2
Pages
7009 - 7011
Database
ISI
SICI code
0021-8979(20010601)89:11<7009:MMOTEO>2.0.ZU;2-O
Abstract
A micromagnetic model has been developed for investigating the effect of st ress on the magnetic properties of thin films. This effect has been impleme nted by including the magnetoelastic energy term into the Landau-Lifshitz-G ilbert equation. Magnetization curves of a nickel film were calculated unde r both tensile and compressive stresses of various magnitudes applied along the field direction. The modeling results show that coercivity increased w ith increasing compressive stress while remanence decreased with increasing tensile stress. The results are in agreement with the experimental data in the literature and can be interpreted in terms of the effects of the appli ed stress on the irreversible rotation of magnetic moments during magnetiza tion reversal under an applied field. (C) 2001 American Institute of Physic s.