T. Eimuller et al., Magnetization reversal of a multilayered FeGd dot array imaged by transmission x-ray microscopy, J APPL PHYS, 89(11), 2001, pp. 7162-7164
The magnetization reversal of an array of 1 mum squared FeGd dots has been
studied by magnetic transmission x-ray microscopy (MTXM). A (4 Angstrom Fe/
4 Angstrom Gd) x 75 multilayered FeGd system has been prepared on a 30 nm t
hin Si3N4 membrane by sputtering and structured by optical lithography and
ion beam etching techniques. Both the domain structure within each single d
ot and the collective switching behavior could be observed with MTXM. A lar
ge variation in the nucleation field of the dots was found and can be attri
buted to the shape of the dots. A correlation between the nucleation field
and the perimeter of each dot could be deduced. Hysteresis loops of individ
ual dots are derived, taking into account the proportionality of the dichro
ic contrast to the magnetization of the sample. The stepped profile of the
magnetization loop of a single dot is found to be clearly distinct from a c
ontinuous film. The high lateral resolution and the possibility to record t
he images in varying external magnetic fields proves that MTXM is a highly
adapted tool to investigate nanostructured magnetic systems. (C) 2001 Ameri
can Institute of Physics.