Two-dimensional analysis of magnetoimpedance in magnetic/metallic multilayers

Citation
Lv. Panina et al., Two-dimensional analysis of magnetoimpedance in magnetic/metallic multilayers, J APPL PHYS, 89(11), 2001, pp. 7221-7223
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
11
Year of publication
2001
Part
2
Pages
7221 - 7223
Database
ISI
SICI code
0021-8979(20010601)89:11<7221:TAOMIM>2.0.ZU;2-2
Abstract
This article concerns the effect of the in-plane film size on the magnetoim pedance (MI) characteristics in magnetic/metallic multilayers. The problem is approached by a two-dimensional solution of the Maxwell equations in a s ymmetrical three-layer film. If the edge effect is neglected, the magnetic flux generated by the current flowing through the film is confined within t he outer magnetic layers. In a finite width sandwich, the flux leaks throug h the inner conductor. This process eventually results in a considerable dr op in MI ratio if this width is smaller than the critical flux decay length depending on the effective transverse permeability, layer thickness, and f requency. (C) 2001 American Institute of Physics.