P. Shang et al., Lorentz microscopy study of magnetization reversal mechanism in magnetic tunnel junction elements, J APPL PHYS, 89(11), 2001, pp. 7368-7370
The magnetization reversal mechanism of four different shaped (rectangular,
elliptical, trapezoidal, and hexagonal) tunnel junction elements with area
ranging from 0.04 to 12 mum(2) has been investigated using Lorentz transmi
ssion electron microscopy. It has been found that the reversal field is inf
luenced by element size and aspect ratio but is not strongly dependent upon
the element shape. 360 degrees domain walls were often observed to form in
the elements and were sustained to a high field when the relative magnetiz
ation configuration of the free and pinned layers changed from parallel to
antiparallel. The formation of 360 degrees domain walls depends strongly on
the shape and aspect ratio of the element, with a lower probability of for
mation in elements with either an aspect ratio of 1:1 or a hexagonal shape.
(C) 2001 American Institute of Physics.