Analysis of the scattered light distribution of a tightly focused laser beam by a particle near a substrate

We present a calculation method to analyze the scattered electromagnetic fi eld by a particle near a substrate. The method is based on the iterative ca lculations of the extended Mie scattering theory [J. P. Barton, D. R. Alexa nder, and S. A. Schaub, J. Appl. Phys. 64, 1632 (1988)] and of plane-wave d ecompositions in order to include the multi-scattering between the particle and the substrate. The method is applicable to an arbitrary incident beam and an arbitrary distance between the particle and the substrate. It is pos sible to analyze the interaction between a particle and a multilayered subs trate. We present the electromagnetic field distribution when the particle near the substrate is illuminated with focused laser beam. (C) 2001 America n Institute of Physics.