Controlled modifications of electron injection on Au/Si and Au/SiO2/Si contacts using ballistic electron emission microscopy

Authors
Chahboun, A Coratger, R Pascale, A Baules, P Ajustron, F Zorkani, I Beauvillain, J
Citation
A. Chahboun et al., Controlled modifications of electron injection on Au/Si and Au/SiO2/Si contacts using ballistic electron emission microscopy, J APPL PHYS, 89(11), 2001, pp. 6302-6307
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF APPLIED PHYSICS
ISSN journal
00218979 → ACNP
Volume
89
Issue
11
Year of publication
2001
Part
1
Pages
6302 - 6307
Database
ISI
SICI code
0021-8979(20010601)89:11<6302:CMOEIO>2.0.ZU;2-8
Abstract
In this article, ballistic electron emission microscopy (BEEM) induced modi fications on Au/Si and Au/SiO2/Si contacts are presented. BEEM current can be locally enhanced or reduced in a controlled manner. These observations a re attributed to tip induced modifications on the gold surface. According t o Au thickness, x-ray reflectivity experiments show different surface evolu tions correlated to the size variations of the modifications introduced as a function of time. (C) 2001 American Institute of Physics.