Modification of chrysotile surface by organosilanes: An IR-photoacoustic spectroscopy study

Citation
E. Mendelovici et al., Modification of chrysotile surface by organosilanes: An IR-photoacoustic spectroscopy study, J COLL I SC, 238(2), 2001, pp. 273-278
Citations number
14
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF COLLOID AND INTERFACE SCIENCE
ISSN journal
00219797 → ACNP
Volume
238
Issue
2
Year of publication
2001
Pages
273 - 278
Database
ISI
SICI code
0021-9797(20010615)238:2<273:MOCSBO>2.0.ZU;2-T
Abstract
Chrysotile and its dimethylsilyl (DMS) and dimethylphenylsilyl (DMPS) deriv atives were studied by Fourier transform infrared-photoacoustic spectroscop y. In the Si-O stretching region of chrysotile a new band was revealed at 9 85 cm(-1), besides absorptions at 1083, 1028, and 947 cm(-1). The Si-O stre tching frequencies did not undergo major changes in the DMS derivative, but the 985- and 1028-cm(-1) peaks were undetected in DMPS due to the HCl atta ck on chrysotile tetrahedral sheets. Similar effects were observed in the r egion 900-400 cm(-1), by a decrease in intensities of the 600- and 642-cm(- 1) Mg-OH libration modes in the DMPS spectrum, indicating also a HCl attack on the octahedral sheet. The Si-C band at 800 cm(-1) in the spectra of bot h DMS and DMPS was accompanied by minor components. DMPS showed a strong pe ak at 813 cm(-1) assigned to a Si-phenyl vibration. A sharp peak at 1263 cm (-1) in the DMS spectrum was ascribed to a diagnostic C-H bending mode of t he dimethylsilyl groups in DMS. The complex bands around 1413 cm(-1) in DMS were attributed to CH3 deformation vibrations and that at 1466 cm(-1) in D MPS to phenyl groups. In DMPS a distinct peak at 1593 cm(-1) was attributed to a Si-phenyl vibration. In the region 3700-2500 cm(-1) absorptions at 29 64, 2931, and 2907 cm(-1) in DMS were ascribed to C-H-stretching vibrations of dimethylsilyl groups, while a strong peak at 2919 cm(-1) in the DMPS sp ectrum was attributed to a Si-C6H5 mode. (C) 2001 Academic Press.