Noise in refrigerating tunnel junctions and in microbolometers

Citation
Dv. Anghel et Jp. Pekola, Noise in refrigerating tunnel junctions and in microbolometers, J L TEMP PH, 123(3-4), 2001, pp. 197-218
Citations number
24
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF LOW TEMPERATURE PHYSICS
ISSN journal
00222291 → ACNP
Volume
123
Issue
3-4
Year of publication
2001
Pages
197 - 218
Database
ISI
SICI code
0022-2291(200105)123:3-4<197:NIRTJA>2.0.ZU;2-Y
Abstract
Microrefrigerators based on normal metal-insulator-superconductor (NIS) jun ctions represent a very attractive alternative to cool the microbolometers and calorimeters for astrophysical observations in space-borne experiments. The performance in such measurements requires a good knowledge of the nois e sources in the detectors. In this paper we present detailed calculations of the thermal fluctuations and of the noise equivalent power due to the he at transfer through the NIS junctions ol the thermal contact between differ ent subsystems of the detector. The influence of the input optical power-wh ich, in the cases that interest us, is the cosmic background radiation-will also be evaluated. Analytical approximations valid at low temperatures are given.