The structure and magnetic properties of multilayer CO82Pt18/C films with e
qual CoPt and C layer thickness have been studied as a function of annealin
g temperature and film thickness. In general, annealing leads to the breaku
p of the continuous films and the formation of a laterally heterogeneous mo
rphology consisting of separate CoPt and C regions. For individual layer th
ickness greater than or equal to 5.3 nm, annealing has no significant effec
t on the crystallographic structure and magnetic properties of the films. I
n both the as-deposited and annealed states, the films have HCP structure w
ith perpendicular c-axis orientation and exhibit perpendicular magnetic ani
sotropy. The structure of these films appears to be associated with the gro
wth of the CoPt on the C layers. For films with individual layer thickness
of 1.3 and 2.7 nm, the structure and magnetic properties are strongly affec
ted by annealing. In the as-deposited state, films have a fine grain struct
ure and coercivities of a few Oe. Annealing leads to the breakup of the mul
tilayer structure at about 300 degreesC and the formation of similar to 20n
m HCP and FCC magnetic grains, with the HCP grains exhibiting in-plane c-ax
is texture. Annealed films have large in-plane coercivities (maximum of 2.7
7 kOe) and random in-plane magnetic anisotropy. The increase in coercivity
with annealing temperature above similar to 375 degreesC is primarily assoc
iated with an increase in switching volume. (C) 2001 Elsevier Science B.V.
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