Dielectric properties of oxide structures by a laser-based direct-writing method

Citation
D. Young et al., Dielectric properties of oxide structures by a laser-based direct-writing method, J MATER RES, 16(6), 2001, pp. 1720-1725
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS RESEARCH
ISSN journal
08842914 → ACNP
Volume
16
Issue
6
Year of publication
2001
Pages
1720 - 1725
Database
ISI
SICI code
0884-2914(200106)16:6<1720:DPOOSB>2.0.ZU;2-7
Abstract
Matrix-assisted pulsed laser evaporation direct-write (MAPLE-DW) is a laser -based method of directly writing mesoscopic patterns of electronic materia ls. Patterns of composite BaTiO2/SiO2/TiO2 dielectric material were written onto Pt/Au interdigitated-electrode test structures, with precise control over final dielectric properties. Scanning electron microscopy indicates ra ndom close-packed structures of BaTiO2 and SiO2 particles, with interstitia l spaces partially filled with titania. Depending on the BaTiO3:silica rati o, the dielectric constant ranged from 5 to 55 and followed a 4-component l ogarithmic rule of mixing. This work demonstrates that the transfer process and the final material properties of MAPLE-DW oxide materials are largely decoupled.