Property characterization of nanomaterials is challenged by the small size
of the structure because of the difficulties in manipulation. Here we demon
strate a novel approach that allows a direct measurement of the mechanical
properties of individual nanotube-like structures by in-situ transmission e
lectron microscopy (TEM). The technique is powerful in a way that it can di
rectly correlate the atomic-scale microstructure of the carbon nanotube wit
h its physical properties, providing a one-to-one correspondence in structu
re-property characterization. Applications of the technique will be demonst
rated on mechanical properties, the electron field emission and the ballist
ic quantum conductance in individual nanotubes.