E. Okunishi et al., High-resolution nano area analysis of plate like precipitate in aluminum alloy employed with Z-contrast and drift corrected EDS mapping, J JPN METAL, 65(5), 2001, pp. 419-422
The HAADF(High Angle Annular Dark Field) method and EDS(Energy Dispersive X
-ray Spectrometer) analysis by the FE-STEM have been used in various resear
ch fields. The observation of the atomic level is possible by the high reso
lution Z-contrast image in the HAADF method. Recently, in the EDS system, t
he drift correction EDS mapping system was developed. And long time element
al mapping becomes possible by using this system and high-resolution two-di
mensional elemental distribution images has come to obtained.
In this paper, The Plate like precipitate called Omega phase in Al alloy as
analyzed by using those methods. As a result, The distribution of Ag in th
e interface between matrix and Omega phase were observed is smaller than 1
nm. Two-dimension distribution image of the atomic layer order was obtained
by using those method.