A micro-mechanics model for imperfect interface in dielectric materials

Authors
Citation
H. Fan et Ky. Sze, A micro-mechanics model for imperfect interface in dielectric materials, MECH MATER, 33(6), 2001, pp. 363-370
Citations number
13
Categorie Soggetti
Material Science & Engineering
Journal title
MECHANICS OF MATERIALS
ISSN journal
01676636 → ACNP
Volume
33
Issue
6
Year of publication
2001
Pages
363 - 370
Database
ISI
SICI code
0167-6636(200106)33:6<363:AMMFII>2.0.ZU;2-C
Abstract
The interface between two dielectric bodies is considered imperfect if ther e are defects (micro-voids and microcracks) present on the interface. For s uch interface, the perfect continuity condition across the interface is no longer valid and its use in analysis becomes questionable. To account for t his imperfection, we propose a micro-mechanics model based on the self-cons istent scheme, leading to the establishment of a constitutive relationship between the electric displacement and potential discontinuity across the im perfect interface. (C) 2001 Elsevier Science Ltd. All rights reserved.