A NOVEL METHOD FOR UNIFORM DISPERSION OF THE RARE-EARTH IONS IN SIO2 GLASS USING ZEOLITE-X
Citation
Y. Fujimoto et M. Nakatsuka, A NOVEL METHOD FOR UNIFORM DISPERSION OF THE RARE-EARTH IONS IN SIO2 GLASS USING ZEOLITE-X, Journal of non-crystalline solids, 215(2-3), 1997, pp. 182-191
Categorie Soggetti
Material Science, Ceramics
SICI code
0022-3093(1997)215:2-3<182:ANMFUD>2.0.ZU;2-Y
Abstract
A novel method for uniform dispersion of the rare earth ions in SiO2 g
lass is presented. Nd doped SiO2 laser glass has been made by aluminum
co-doping to avoid quenching due to Nd clustering. Previous works wit
h aluminum co-doping were passive methods because uniform dispersion o
f the rare earth ions in SiO2 glass depended only on aluminum co-dopin
g effect. Concentration quenching of Nd laser glass is explained by cr
oss-relaxation process and depends on Nd-Nd distance in the glass. The
shorter the Nd-Nd distance the stronger is quenching, so the distance
should be greater than some minimum. Homogeneous rare earth doped SiO
2 glass is achieved by a modified sol-gel method using zeolite X. Zeol
ite X (Na-86[(AlO2)(86). (SiO2)(106)] . 264H(2)O, faujasite-type struc
ture) is a suitable material because Nd ions are selectively exchanged
at the D6R segment structure in zeolite X, and the distance between N
d ions in the D6R is 0.88 nm. This distance is three times larger than
the critical range of cross-relaxation process which causes quenching
. If the Nd-Nd distance is kept at 0.88 nm, the ratio of cross-relaxat
ion probability to radiative decay probability will be 0.23%. Quantum
yield is an adequate quantity for confirming uniform dispersion of the
rare earth ions in Nd doped laser media. For a newly prepared Nd dope
d SiO2 glass using zeolite X, quantum yield increased to 50 +/- 3.4% a
t 1.0 wt%, while an ordinary produced one was 7 +/- 0.5%. (C) 1997 Els
evier Science B.V.