Hydrogen plasma passivation of bulk GaAs and Al0.3Ga0.7As/GaAs multiple-quantum-well structures on Si substrates

Citation
G. Wang et al., Hydrogen plasma passivation of bulk GaAs and Al0.3Ga0.7As/GaAs multiple-quantum-well structures on Si substrates, J ELEC MAT, 30(7), 2001, pp. 845-849
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
30
Issue
7
Year of publication
2001
Pages
845 - 849
Database
ISI
SICI code
0361-5235(200107)30:7<845:HPPOBG>2.0.ZU;2-Y
Abstract
Hydrogen (H) plasma passivation effects on GaAs grown on Si substrates (GaA s on Si) are investigated in detail. H plasma exposure effectively passivat es both the shallow and deep defects in GaAs on Si, which improves both the electrical and optical properties. It was found that the minority carrier lifetime is increased and the deep level concentration is decreased by the H plasma exposure. In addition, after H plasma exposure, room temperature p hotoluminescence (PL) for Al0.3Ga0.7As/GaAs multiple-quantum-well (MQW) on Si is enhanced with a decrease in the spectral width.