High temperature transport property of B- and P-doped GeSi single crystalsprepared by a Czochralski method

Citation
T. Akashi et al., High temperature transport property of B- and P-doped GeSi single crystalsprepared by a Czochralski method, MATER TRANS, 42(6), 2001, pp. 1024-1027
Citations number
20
Categorie Soggetti
Material Science & Engineering
Journal title
MATERIALS TRANSACTIONS
ISSN journal
13459678 → ACNP
Volume
42
Issue
6
Year of publication
2001
Pages
1024 - 1027
Database
ISI
SICI code
1345-9678(200106)42:6<1024:HTTPOB>2.0.ZU;2-X
Abstract
B-doped (p-type) and P-doped (n-type) Ge0.07Si0.93 single crystals were pre pared by a Czochralski (CZ) method. The anisotropy of Seebeck coefficient ( cr), electrical conductivity (a) and thermal conductivity (kappa) among the [001], [110] and [111] directions was determined and the values were compa red with those of polycrystalline materials. The Seebeck coefficient of B-d oped specimen in the [111] direction (alpha (111)) was the same as that in the [110] direction (alpha (110)), and was greater than that in the [001] d irection (alpha 001) measured at all temperature. The alpha (111), alpha (1 10) and alpha (100) of the P-doped specimens were in agreement above 600 K, but anisotropy of alpha values was observed below 500 K, (\alpha 001\ > \a lpha (111)\ > \alpha (110)\) No anisotropy of sigma and kappa was observed in both B- and P-doped specimens. The thermal conductivity of B- and P-dope d single crystal specimens were much greater than that of polycrystalline m aterials.