Hs. Wu et Sy. Tong, Surface Patterson function by inversion of low-energy electron diffractionI-V spectra at multiple incident angles - art. no. 036101, PHYS REV L, 8703(3), 2001, pp. 6101-NIL_92
An accurate Patterson function, free of artifacts, is obtained by transform
ing low-energy electron diffraction I-V spectra at multiple incident angles
. The demonstration is carried out using normal incidence measured spectra
and calculated spectra at three angles of incidence. The errors between int
ensity spots in the Patterson function and known interatomic distances are
less than 0.01 Angstrom in the horizontal direction and 0.09 Angstrom in th
e vertical direction. The reason for the high accuracy in the horizontal di
rection is given.