Contribution of edge recoiling of diffusion to anomalous transient photo-currents in amorphous materials

We demonstrate that the edge recoiling of diffusion may cause anomaly in tr ansient photo-currents measured by the time-of-flight technique for homogen eous amorphous materials. The universality of the anomalous transports is s uccessfully revealed in this new macroscopic explanation. The anomaly in th e transient currents is directly related to the degree of the diffusion and the drift. In the previously established continuous-time-random-walk theor y, similar anomalous transports were attributed to some unusual microscopic process of retarded trapping-releasing and hopping. We show that the same effects may present in homogeneous materials with normal diffusion process. (C) 2001 Published by Elsevier Science B.V.