The electron pinch lifetime in high-current rod pinch diodes

Citation
Sy. Belomyttsev et Vv. Ryzhov, The electron pinch lifetime in high-current rod pinch diodes, TECH PHYS L, 27(7), 2001, pp. 608-610
Citations number
3
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
TECHNICAL PHYSICS LETTERS
ISSN journal
10637850 → ACNP
Volume
27
Issue
7
Year of publication
2001
Pages
608 - 610
Database
ISI
SICI code
1063-7850(2001)27:7<608:TEPLIH>2.0.ZU;2-Y
Abstract
In high-current coaxial diodes with rod anode (rod pinch diodes), the curre nt of the magnetic self-insulation in the gap is approximately two times gr eater than the critical magnetic insulation current (J(S) approximate to 2J (C)). Based on this fact, a model is proposed according to which a quasista tionary electron pinch state in such diodes is explained by a change in the gap magnetic insulation conditions caused by the pinch formation. This cir cumstance can be used to evaluate the pinch lifetime Deltat. The Deltat val ues calculated using the oscillograms measured on the Gamble I accelerator agree satisfactorily with the values experimentally determined in a coaxial rod pinch diode. (C) 2001 MAIK "Nauka/ Interperiodica".