B. Hunsche et al., Effect of deposition parameters on optical and mechanical properties of MF- and DC-sputtered Nb2O5 films, THIN SOL FI, 392(2), 2001, pp. 184-190
Niobium-pentoxide films with thicknesses of 100 nm to 1 mum were deposited
by both DC and mid-frequency (MF) magnetron sputtering using a dual magnetr
on (TwinMag((R))) configuration. Stress measurements were performed by dete
rmining the substrate curvature before and after deposition for various pro
cess parameters. By varying the argon or oxygen partial pressure, it could
be shown that a minimization of the undesired compressive stress, caused by
the particle bombardment, is attainable. It was found that the limits for
achieving this strongly depend on the applied process (MF or DC) as well as
on the target state (oxide or transition mode). The films were characteriz
ed using SEM, AFM, vibrating reed, EPMA, and XRD yielding information conce
rning morphology, stoichiometry, phase, and surface roughness. Furthermore,
ellipsometric measurements allowed the determination of the film thickness
es and the refractive indices (n(550 nm) = 2.4) which turned out to be high
ly correlated to the stress values. (C) 2001 Elsevier Science B.V. All righ
ts reserved.