A dual-material structure of lattice-matched GaInP on GaAs has a calcu
lated figure of merit which is approximately 60 times better than Si a
nd 5 times better than GaAs. In this work, the theoretical performance
of the GaInP/GaAs structure is presented and experimental data for Ni
on GaInP/GaAs Schottky rectifiers is presented, The Ni on GaInP/GaAs
Schottky rectifiers have a breakdown voltage of similar to 80 V and lo
w reverse leakage current. Comparable Ni on GaAs Schottky rectifiers h
ave a breakdown voltage of similar to 20 V and significantly higher re
verse leakage current. The GaInP/GaAs rectifiers' forward characterist
ics have a current-voltage extracted phi(Bn), of 1.0 eV with an ideali
ty factor of 1.06. This dual-material structure of GaInP/GaAs appears
to be a promising candidate for improving power device performance. (C
) 1997 American Institute of Physics.