Direct signature of strained GaN quantum dots by Raman scattering

Citation
J. Gleize et al., Direct signature of strained GaN quantum dots by Raman scattering, APPL PHYS L, 79(5), 2001, pp. 686-688
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
5
Year of publication
2001
Pages
686 - 688
Database
ISI
SICI code
0003-6951(20010730)79:5<686:DSOSGQ>2.0.ZU;2-L
Abstract
We report on a Raman study of strained wurtzite GaN quantum dots embedded i n AlN spacers. Various laser excitations between 2.33 and 3.81 eV were used , which allows for selective probing of the dots, through resonant enhancem ent of the Raman signal. A direct signature of the A(1) (LO) and E-2 phonon s of the GaN dots has been obtained. The measured phonon frequencies show t hat the mean in-plane strain inside the GaN dots approaches the lattice mis match between GaN and AlN. (C) 2001 American Institute of Physics.