Scanning probe microscopy studies of carbon nanotubes

This paper summarizes scanning probe microscopy investigations of the prope rties and manipulation of carbon nanotubes, and moreover, the fabrication a nd utilization of nanotubes as novel tips for probe microscopy experiments. First, scanning tunneling microscopy and spectroscopy measurements that el ucidate (1) the basic relationship between Single-Walled Carbon Nanotube (S WNT) atomic structure and electronic properties, (2) the one-dimensional ba nd structure of nanotubes, (3) localized structures in SWNTs, and (4) the e lectronic behavior of finite-size SWNTs are discussed. Second, atomic force microscopy investigations of the manipulation of nanotubes on surfaces to obtain information about nanotube-surface interactions and nanotube mechani cal properties, and to create nanotube device structures are reviewed. Last ly, the fabrication, properties and application of carbon nanotube probe mi croscopy tips to ultrahigh resolution and chemically sensitive imaging are summarized. Prospects for future research are discussed.