K. Hirokawa et al., Role of electronegativity in the qualitative inference of the TOF-SIMS fragment pattern of inorganic compounds, FRESEN J AN, 370(4), 2001, pp. 348-357
The role of the electronegativity of atoms in inorganic compounds in TOF-SI
MS fragmentation is discussed. From a study of approximately 30 inorganic c
ompounds-chlorides, oxides, nitrates, and sulfates-a simple rule has been p
roposed for the dependence of fragment pattern appearance on the electroneg
ativity (electron affinity), which can be easily obtained from handbooks, a
nd the valence of positive and negative ions in these compounds. TOF-SIMS m
easurements of metal and alloy surfaces, should be corrected for the ioniza
tion potentials and/or electronegativities of atoms present in surface cont
aminants.