A detailed investigation of the quantum yield experiment

A detailed investigation of the quantum yield (QY) experiment is proposed, Experimental data show that no correlation exists between the QY and the st ress-induced leakage current (SILC), and that the QY is determined by high- energy oxide traps, Numerical simulations are then used, based on a detaile d calculation of the oxide defect distribution. It is shown that the leakag e current and the excess impact ionization component are due to trap-assist ed tunneling (TAT) of electrons through different sets of traps: Deep level s are responsible for the SILC, while high-energy states determine the impa ct ionization current. Simulation results are in good agreement with experi ments, showing that the QY results cannot be used to extract the energy los s of the SILC electrons.