Cleaning procedure for single-crystal tungsten substrates

Citation
R. Cortenraad et al., Cleaning procedure for single-crystal tungsten substrates, INORG MATER, 37(7), 2001, pp. 673-677
Citations number
2
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
INORGANIC MATERIALS
ISSN journal
00201685 → ACNP
Volume
37
Issue
7
Year of publication
2001
Pages
673 - 677
Database
ISI
SICI code
0020-1685(200107)37:7<673:CPFSTS>2.0.ZU;2-H
Abstract
Single-crystal tungsten substrates produced by electron-beam melting were c leaned by annealing in an oxygen atmosphere (similar to 10(-3) Pa, similar or equal to 2500 degreesC) for a few hours to remove adsorbed carbon and by high-temperature ultrahigh-vacuum annealing (similar or equal to2 x 10(-8) Pa, greater than or equal to 2500 degreesC) for a few minutes to remove re sidual oxygen. The process was followed by low-energy ion scattering, Auger electron spectroscopy, and low-energy electron diffraction. The carbon and oxygen adsorbed on the surface of single-crystal tungsten were found to fo rm ordered, oriented structures. The resultant high-purity, structurally pe rfect W substrates were used to study electron emission in the Ba/W and Re/ W systems.