A study of adhesion forces by atomic force microscopy

Citation
C. Jacquot et J. Takadoum, A study of adhesion forces by atomic force microscopy, J ADHES SCI, 15(6), 2001, pp. 681-687
Citations number
9
Categorie Soggetti
Material Science & Engineering
Journal title
JOURNAL OF ADHESION SCIENCE AND TECHNOLOGY
ISSN journal
01694243 → ACNP
Volume
15
Issue
6
Year of publication
2001
Pages
681 - 687
Database
ISI
SICI code
0169-4243(2001)15:6<681:ASOAFB>2.0.ZU;2-D
Abstract
An atomic force microscope (AFM) was used to investigate Si3N4 tip interact ions with various materials in four different liquid media (water, ethanol, ethylene glycol, and formamide). The adhesion forces calculated using surf ace energies and the values measured experimentally were compared. For all materials, the calculated adhesion force closely correlated with AFM measur ements, except in water. In the case of water, the AFM experiments showed s trong adhesion. whereas theoretically (van Oss-Chaudhury-Good model) repuls ion is predicted. The difference observed is discussed in terms of the chem ical interactions between Si3N4 and water.