The interface of thin films of Fe/NiO (1 0 0)-oriented single crystals was
studied by X-ray magnetic circular dichroism (XMCD). Thin layers of Fe were
removed by "in situ" sputtering, followed by XMCD measurements, resulting
in a depth profile. A decrease from the bulk value in the value of the Fe m
oment Lit the interface of Fe with the antiferromagnetic NiO(100) was obser
ved. (C) 2001 Elsevier Science B.V. All rights reserved.