X-ray magnetic circular dichroism in Fe/NiO thin films

Authors
Alvarenga, AD Garcia, F Sampaio, LC Giles, C Yokaichiya, F Achete, CA Simao, RA Guimaraes, AP
Citation
Ad. Alvarenga et al., X-ray magnetic circular dichroism in Fe/NiO thin films, J MAGN MAGN, 233(1-2), 2001, pp. 74-77
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS
ISSN journal
03048853 → ACNP
Volume
233
Issue
1-2
Year of publication
2001
Pages
74 - 77
Database
ISI
SICI code
0304-8853(200107)233:1-2<74:XMCDIF>2.0.ZU;2-X
Abstract
The interface of thin films of Fe/NiO (1 0 0)-oriented single crystals was studied by X-ray magnetic circular dichroism (XMCD). Thin layers of Fe were removed by "in situ" sputtering, followed by XMCD measurements, resulting in a depth profile. A decrease from the bulk value in the value of the Fe m oment Lit the interface of Fe with the antiferromagnetic NiO(100) was obser ved. (C) 2001 Elsevier Science B.V. All rights reserved.