INVESTIGATION OF THE COUPLING BETWEEN THE OUTER ELECTRODES IN THE SUPERCONDUCTING DOUBLE-BARRIER DEVICES

Authors
NEVIRKOVETS IP EVETTES JE BLAMIRE MG BARBER ZH GOLDOBIN E
Citation
Ip. Nevirkovets et al., INVESTIGATION OF THE COUPLING BETWEEN THE OUTER ELECTRODES IN THE SUPERCONDUCTING DOUBLE-BARRIER DEVICES, Physics letters. A, 232(3-4), 1997, pp. 299-304
Citations number
15
Categorie Soggetti
Physics
Journal title
Physics letters. A → ACNP
ISSN journal
03759601
Volume
232
Issue
3-4
Year of publication
1997
Pages
299 - 304
Database
ISI
SICI code
0375-9601(1997)232:3-4<299:IOTCBT>2.0.ZU;2-O
Abstract
It is found experimentally that the critical current in the two-termin al double-barrier Nb/Ai-AlOx-Nb/Al-AlOx-Nb device is considerably larg er than the critical current in the bottom junction of tile Nb/Al-AlOx -Nb/Al-AlOx-Ta/Nb device of identical planar configuration produced in the same deposition run. Our data suggest that the origin of the phen omena is a direct Josephson coupling between the external electrodes r ather than the inductive interaction between the junctions. (C) 1997 E lsevier Science B.V.