Using the statistical probability-based model of an irregular mixed-layer structure for describing the real structures of chemically nonhomogeneous single crystals

This paper discusses the theoretical and experimental aspects of modeling o f irregular mixed-layer structures of chemically nonhomogeneous single crys tals based on X-ray diffraction data. The available data on natural and syn thetic single crystals of different structural types belonging to different polysomatic and isomorphic series are reviewed. Two basic types of structu re are described, and criteria for their diagnostics by diffraction pattern s are formulated. The range of substances to which this approach is applica ble is analyzed. It is shown on particular examples that the statistical pr obability-based model of an irregular mixed-layer structure is applicable t o quantitative description of lamellar isomorphism, fine oscillation zoning , decay structures of solid solutions, and nonhomogeneous organic thin film structures.