Polarization spectroscopy of a conducting surface

A method of polarization spectroscopy for a conducting surface characterize d by a high sensitivity to the state of the surface and its transition laye r is proposed. The method uses excitation of surface electromagnetic waves (SEWs) by a linearly polarized probe beam incident on the surface under stu dy and compensation for the phase shift between the p and s components aris ing upon the SEW excitation. The applicability and competitiveness of the m ethod in both the visible and the IR range is established. The method is te sted on an LEF-3M ellipsometer in the visible range by studying the oxidati on process in an evaporated copper film. (C) 2001 MAIK "Nauka/Interperiodic a".