Raman scattering is shown to provide an effective means to measure spatial
correlations in self-assembled quantum dot multilayers. Raman scattering in
terferences occur when an acoustic phonon interacts with an ensemble of loc
alized electronic stales. The interference contrast depends on their spatia
l correlations. Vertical correlations in self-assembled Ge/Si quantum dot m
ultilayers are deduced from the interference contrast and successfully comp
ared with those measured by transmission electron microscopy.