The creation of reliable instrumentation for performing complex reflectance
and transmittance measurements of dielectrics, metals, and superconductors
in the frequency range from 60 GHz to 1.5 THz is reported. The system allo
ws continuous variation of the THz radiation incidence angle from 25 degree
s to 80 degrees without major realignment of the optics and provides the si
gnal-to-noise ratio of 1000:1. (C) 2001 American Institute of Physics.