Recording at the nanometer scale on p-nitrobenzonitrile thin films by scanning tunneling microscopy

Authors
Shi, DX Song, YL Zhu, DB Zhang, HX Xie, SH Pang, SJ Gao, HJ
Citation
Dx. Shi et al., Recording at the nanometer scale on p-nitrobenzonitrile thin films by scanning tunneling microscopy, ADVAN MATER, 13(14), 2001, pp. 1103
Citations number
27
Categorie Soggetti
Multidisciplinary,"Material Science & Engineering
Journal title
ADVANCED MATERIALS
ISSN journal
09359648 → ACNP
Volume
13
Issue
14
Year of publication
2001
Database
ISI
SICI code
0935-9648(20010718)13:14<1103:RATNSO>2.0.ZU;2-3
Abstract
A data storage density of at least 10(14) bits/cm(2) is possible using p-ni trobenzonitrile as the data storage medium and scanning tunneling microscop y (STM) as the recording method. This represents the smallest mark size amo ng all the organic thin films studied by these authors. The figure shows a typical STM image of a recorded pattern.