We present a general description of white-beam (Laue) scattering from grain
s with dislocations. This approach is applied to examples with equal number
s of positive and negative Burger's vectors (paired) and with unpaired disl
ocations of one sign (geometrically necessary). We find that streaking of t
he Laue reflections is sensitive to both long-range geometrical rotations i
ntroduced by unpaired edge dislocations and to local rotation fluctuations
introduced by the total number of dislocations (paired and unpaired). We de
monstrate the technique by analyzing the dislocation distribution in a nano
indented Cu single crystal. (C) 2001 American Institute of Physics.