Yml. Yang et al., Oxygen exchange kinetics on a highly oriented La0.5Sr0.5CoO3-delta thin film prepared by pulsed-laser deposition, APPL PHYS L, 79(6), 2001, pp. 776-778
Oxygen exchange at a highly oriented La0.5Sr0.5CoO3-delta thin film prepare
d on (100) surfaces of an yttria-stabilized zirconia single crystal by puls
ed-laser deposition was studied with ac impedance spectroscopy under variou
s temperatures and oxygen partial pressures. Three distinctive features obs
erved in the impedance spectra were assigned to contributions from the ioni
c conduction of the electrolyte, oxide ion transfer across the electrode/el
ectrolyte interface, and the oxygen exchange on the film surface. An equiva
lent circuit model was proposed to analyze the impedance results, from whic
h the surface chemical exchange coefficients, k(chem), were derived as a fu
nction of temperature and oxygen partial pressure. (C) 2001 American Instit
ute of Physics.