Transport through a nine period silicon/oxygen superlattice

Citation
Yj. Seo et al., Transport through a nine period silicon/oxygen superlattice, APPL PHYS L, 79(6), 2001, pp. 788-790
Citations number
8
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
79
Issue
6
Year of publication
2001
Pages
788 - 790
Database
ISI
SICI code
0003-6951(20010806)79:6<788:TTANPS>2.0.ZU;2-V
Abstract
The silicon/adsorbed oxygen superlattice was introduced as an epitaxial bar rier for silicon quantum devices. A barrier height of similar to0.5 eV with a thin layer of silicon sandwiched between two adsorbed oxygen layers has been achieved. This work describes a similar structure with nine periods wh ich may serve as a replacement of the present amorphous silicon dioxide gat e for metal oxide semiconductor field effect transistor. The insulating pro perty derived from our current-voltage (I-V) and conductance-voltage (G-V) measurements indicates that the scheme may serve as a replacement of silico n on insulator. (C) 2001 American Institute of Physics.