Ultraviolet-visible near-field microscopy of phase-separated blends of polyfluorene-based conjugated semiconductors

We have used fluorescence scanning near-field microscopy to characterize po lymer blends for electroluminescent applications, and thereby identify comp ositional nonhomogeneities. In particular, we have focused on the binary sy stem constituted by poly(9,9'-dioctylfluorenealt-benzothiadiazole) and poly (9,9'-dioctylfluorene) (PFO), known to give efficiencies of up to 22 cd/A i n light-emitting devices with suitable electrodes. Our primary aim was the assignment of the morphological features revealed in shear-force and atomic -force images of spin-coated films, and suggestive of phase separation on a 300-nm-length scale. From analysis of the fluorescence images (325 and 488 nm excitation), and quantitative correlation of optical and topographic da ta, we identify the raised features with PFO-rich regions. However, the lim ited variation in fluorescence intensity reveals a high extent of mixing wi thin each phase on the length scale accessible in our experiment, approxima tely 100 nm for our focused-ion-beam-processed probe apertures. (C) 2001 Am erican Institute of Physics.