A study of the threshold photoelectron spectra and the photoionisation yield curves of the silicon tetrahalides

Citation
L. Cooper et al., A study of the threshold photoelectron spectra and the photoionisation yield curves of the silicon tetrahalides, CHEM PHYS, 270(2), 2001, pp. 363-381
Citations number
64
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CHEMICAL PHYSICS
ISSN journal
03010104 → ACNP
Volume
270
Issue
2
Year of publication
2001
Pages
363 - 381
Database
ISI
SICI code
0301-0104(20010801)270:2<363:ASOTTP>2.0.ZU;2-7
Abstract
The threshold photoelectron spectra and the photoionisation yield curves of SiF4, SiCl4 and SiBr4 have been recorded in the photon energy range 10-240 eV using synchrotron radiation. The outer valence shell photoelectron band s exhibit effects due to spin-orbit splitting and to Jahn-Teller interactio ns, and vibrational progressions associated with the Jahn-Teller active mod es have been observed. The continuous nature of the inner valence shell pho toelectron bands and the absence of main-lines demonstrates the importance of electron correlation in redistributing the intensity amongst satellite s tates. New Rydberg series have been observed in the photoionisation yield c urves associated with excitation from the valence shell, and the improved r esolution has allowed some earlier assignment discrepancies to be clarified . The threshold photoelectron spectra and ion yield curves recorded at high er energies display features attributable to the Si 2p,2s, Cl 2p and Br 3p shells. The photoelectron spectra have enabled the following splittings to be measured: Si 2p-2s, Si 2p(1/2)-2p(3/2), Cl2p(1/2)-2p(3/2) and Br 3p(1/2) -3P(3/2), and the corresponding values are 51.21, 0.52, 1.62 and 4.6 eV, re spectively. The interpretation of the features observed in the SiBr4 spectr a has been based upon previously reported assignments of similar structure in SiF4. (C) 2001 Elsevier Science B.V. All rights reserved.