ELASTIC SOFTNESS OF AMORPHOUS TETRAHEDRALLY BONDED GASB AND (GE-2)(0.27)(GASB)(0.73) SEMICONDUCTORS

Citation
Vv. Brazhkin et al., ELASTIC SOFTNESS OF AMORPHOUS TETRAHEDRALLY BONDED GASB AND (GE-2)(0.27)(GASB)(0.73) SEMICONDUCTORS, Physical review. B, Condensed matter, 56(3), 1997, pp. 990-993
Citations number
31
Categorie Soggetti
Physics, Condensed Matter
ISSN journal
01631829
Volume
56
Issue
3
Year of publication
1997
Pages
990 - 993
Database
ISI
SICI code
0163-1829(1997)56:3<990:ESOATB>2.0.ZU;2-M
Abstract
We have measured the longitudinal and transverse acoustic wave velocit ies in bulk pressure-amorphized alpha-GaSb and alpha-(Ge-2)(0.27)(GaSb )(0.73) semiconductors and in their polycrystalline analogs. Although the densities of crystalline and amorphous states were practically equ al, a significant softening of the bulk (29-35 %) and shear (41-46 %) elastic moduli has been found for amorphous phases. The ultrasonic dat a for bulk moduli are in good agreement with the previous direct volum etric measurements. Results of the present study combined with critica l review of previous works allowed us to find specific features of ela stic behavior of amorphous tetrahedral semiconductors (including group IV elements and group III-V compounds), and compare them to other cla sses of disordered solids.