Reaction analysis in stripline circuits

Citation
S. Kabir et al., Reaction analysis in stripline circuits, IEEE T AD P, 24(3), 2001, pp. 347-356
Citations number
23
Categorie Soggetti
Material Science & Engineering
Journal title
IEEE TRANSACTIONS ON ADVANCED PACKAGING
ISSN journal
15213323 → ACNP
Volume
24
Issue
3
Year of publication
2001
Pages
347 - 356
Database
ISI
SICI code
1521-3323(200108)24:3<347:RAISC>2.0.ZU;2-1
Abstract
In this paper, a full-wave layered-interconnect simulator (UA-FWLIS), which is capable of simulating EM effects in packaging-interconnect problems, is introduced. Standard integral-equation-based Method of Moment (MoM) techni ques are employed in UA-FWLIS. However, instead of using, standard time-con suming numerical integration techniques, we have analytically evaluated the MoM reaction elements, thereby greatly improving the computational efficie ncy of the simulator. This paper illustrates the application of the simulat or by employing it in the studies of coupling in a stripline structure and S-parameters for an interconnect.