In this paper, a full-wave layered-interconnect simulator (UA-FWLIS), which
is capable of simulating EM effects in packaging-interconnect problems, is
introduced. Standard integral-equation-based Method of Moment (MoM) techni
ques are employed in UA-FWLIS. However, instead of using, standard time-con
suming numerical integration techniques, we have analytically evaluated the
MoM reaction elements, thereby greatly improving the computational efficie
ncy of the simulator. This paper illustrates the application of the simulat
or by employing it in the studies of coupling in a stripline structure and
S-parameters for an interconnect.