Structural and optical properties of thick freestanding GaN templates

Citation
Ja. Freitas et al., Structural and optical properties of thick freestanding GaN templates, J CRYST GR, 231(3), 2001, pp. 322-328
Citations number
21
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
231
Issue
3
Year of publication
2001
Pages
322 - 328
Database
ISI
SICI code
0022-0248(200110)231:3<322:SAOPOT>2.0.ZU;2-H
Abstract
Structural and optical properties of thick (larger than 160 mum) freestandi ng hydride vapor phase epitaxy GaN templates have been investigated. AFM me asurements showed that flat and smooth surface could be fabricated. High-re solution X-ray diffraction studies carried out with different spectrometer slit for the symmetric and asymmetric diffractions show that the linewidth increases with increasing slits width. indicating that a considerable degre e of tilting and twisting of the individual grains are still present in the se thick samples. Raman scattering measurements performed in a few samples indicate good crystalline quality and reduced strain. Very sharp and intens e exciton related lines (FWHM less than I meV) have been observed in the lo w temperature photoluminescence spectra. Variable-temperature photoluminesc ence experiments were performed on both the growth surface and interface to identify the nature of the recombination processes observed in the lumines cence spectra. FTIR absorption measurements show the presence of at least t wo donors with binding energy of 30.5 and 33.6 meV. (C) 2001 Elsevier Scien ce B.V. All rights reserved.