Changing the size and shape of Ge island by chemical etching

Citation
F. Gao et al., Changing the size and shape of Ge island by chemical etching, J CRYST GR, 231(1-2), 2001, pp. 17-21
Citations number
15
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
231
Issue
1-2
Year of publication
2001
Pages
17 - 21
Database
ISI
SICI code
0022-0248(200109)231:1-2<17:CTSASO>2.0.ZU;2-8
Abstract
Self-assembled Ge islands were grown on Si (1 0 0) substrate by Si2H6-Ge mo lecular beam epitaxy. Subjected to a chemical etching, it is found that the size and shape (i.e. ratio of height to base width) of Ge islands change w ith etching time. In addition, the photoluminescence from the etched Ge isl ands shifted to the higher energy side compared to that of the as-deposited Ge islands. Our results demonstrated that chemical etching can be a way to change the size and shape of the as-deposited islands as well as their lum inescence property. (C) 2001 Elsevier Science B.V. All rights reserved.