High-resolution valence band XPS studies of thin film Au-Al alloys

Citation
H. Piao et Ns. Mcintyre, High-resolution valence band XPS studies of thin film Au-Al alloys, J ELEC SPEC, 119(1), 2001, pp. 29-33
Citations number
19
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
119
Issue
1
Year of publication
2001
Pages
29 - 33
Database
ISI
SICI code
0368-2048(200107)119:1<29:HVBXSO>2.0.ZU;2-8
Abstract
The Maximum Entropy Method (MEM) has been used to deconvolute the valence-b and XPS spectra of thin film Au-Al alloys. The enhanced resolution allows f ine changes in the electronic structures of the thin film alloys to be dist inguished with the aid of the Au4f core-level spectra. This particular allo y series allows one to examine the 5d electronic interaction between gold a toms as aluminum is gradually added to the matrix. Aluminum is shown to hav e a much stronger quenching effect on such interactions than has been found previously for copper. (C) 2001 Elsevier Science B.V. All rights reserved.