Cubic silicon nitride embedded in amorphous silicon dioxide

A cubic silicon nitride embedded in amorphous SiO2 compound has been charac terized by means of high-resolution analytical electron microscopy. The spe cimen was prepared from beta -Si3N4 powders at a high pressure and temperat ure by shock wave compression. The typical high-resolution electron microsc opy image from one small crystallite together with its diffractodiagram pat tern indicated that the Si3N4 crystallites had a cubic symmetry. The electr on energy loss spectrum from the small crystallite is very different from t hose of outside amorphous SiO2 phase and raw beta -Si3N4 particles, and the re are more N elements that were detected in this small crystallite than th ose in standard Si3N4.