Transmission electron microscopy observation in a liquid-phase-sintered SiC with oxynitride glass

Citation
Gd. Zhan et al., Transmission electron microscopy observation in a liquid-phase-sintered SiC with oxynitride glass, J MATER RES, 16(8), 2001, pp. 2189-2191
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS RESEARCH
ISSN journal
08842914 → ACNP
Volume
16
Issue
8
Year of publication
2001
Pages
2189 - 2191
Database
ISI
SICI code
0884-2914(200108)16:8<2189:TEMOIA>2.0.ZU;2-7
Abstract
Using a pure alpha -SiC starting powder and an oxynitride glass composition from the Y-Mg-Si-Al-O-N system as a sintering additive, a powder mixture w as hot-pressed at 1850 degreesC for 1 h under a pressure of 20 MPa and furt her annealed at 2000 degreesC for 4 h in a nitrogen atmosphere of 0.1 MPa. High-resolution electron microscopy and x-ray diffraction studies confirmed that a small amount of beta -SiC was observed in the liquid-phase-sintered alpha -SiC with this oxynitride glass, indicating stability of beta -SiC e ven at high annealing temperature, due to the nitrogen-containing liquid ph ase.